Yoshihide Wakayama: "Controlled Contamination Experiments of Gate Oxide Surfaces by Organic Compounds and Their Effect on the Reliability of MOS Devices"International Conference on Materials Science and Technologies. 130-135 (2000)
Yoshihide Wakayama: "Controlled Contamination Experiments of Gate Oxide Surfaces by Organic Compounds and Their Effect on the Reliability of MOS Devices"International Conference on Materials Science and Technologies. 130-135 (2000)
复制标题
Yoshihide Wakayama：“有机化合物对栅极氧化物表面的控制污染实验及其对 MOS 器件可靠性的影响”材料科学与技术国际会议。
DOI：
--
复制
发表时间：
--
期刊：
影响因子：
--
通讯作者：
中科院分区：
文献类型：
--
作者：
