Structural change of Ga2O3 film on GaN(0001) substrate by atomic layer deposition and post deposition annealing
Structural change of Ga2O3 film on GaN(0001) substrate by atomic layer deposition and post deposition annealing
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原子层沉积和沉积后退火在GaN(0001)衬底上Ga2O3薄膜的结构变化
DOI:
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发表时间:
2022
期刊:
影响因子:
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通讯作者:
and Kazuhito Tsukagoshi
中科院分区:
文献类型:
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作者:
Tomomi Sawada;Toshihide Nabatame;Makoto Takahashi;Kazuhiro Ito;Takashi Onaya;Yoshihiro Irokawa;Yasuo Koide;and Kazuhito Tsukagoshi