Short‐Range Order Investigation of CuxGe50-xTe50 Phase‐Change Materials
Short‐Range Order Investigation of CuxGe50-xTe50 Phase‐Change Materials
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CuxGe50-xTe50 相变材料的短程有序研究
DOI：
10.1002/pssb.202100619
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发表时间：
2022
期刊：
影响因子：
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通讯作者：
Pilgrim Wolf-Christian
中科院分区：
文献类型：
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作者：
Paulus Benedict;Stellhorn Jens R.;Hosokawa Shinya;Klee Benjamin D.;Sutou Yuji;Pilgrim Wolf-Christian
非晶相变材料（CGT）的结晶稳定性在低铜浓度下表现出异常行为，是最稳定的组成。使用扩展X射线吸收精细结构（EXAFS）在10 K下的Ge-K、Cu-K和Te-K边缘分析了具有、15和25的三种CGT成分。EXAFS分析表明，在Cu浓度为2.8 ~ 4.0 at. Cu-EXAFS光谱表明，低浓度的Cu（和）形成的Cu团簇。通过X射线吸收近边结构计算进一步分析了这些团簇的存在，支持小的多面体和/或盘状Cu团簇，这些团簇通过Cu Te键与周围的非晶GeTe基质连接。因此，GeTe网络是Te富集的，导致Ge_xTe键的最大值为。结果，这建立了稳定化以防止结晶的无定形网络。
The stability against crystallization of the amorphous phase‐change materials(CGT) exhibits an unusual behavior at low Cu concentrations withbeing the most stable composition. Three CGT compositions with, 15, and 25 are analyzed using extended X‐ray absorption fine structure (EXAFS) at the Ge‐K, Cu‐K, and Te‐K edge at 10 K. EXAFS analysis shows that the average coordination number (CN) increases with the Cu concentration from 2.8 atto 4.0 at. Cu‐EXAFS spectra indicate the formation of Cu clusters for low Cu concentrations (and). The existence of these clusters is further analyzed by X‐ray absorption near‐edge structure calculations, supporting small polyhedral and/or disk‐like Cu clusters which are linked to the surrounding amorphous GeTe matrix via CuTe bonds. Hence, the GeTe network is Te enriched, leading to a maximum of GeTe bonds at. As a result, this establishes an amorphous network which is stabilized against crystallization.