Structural In-Field Diagnosis for Random Logic Circuits
Structural In-Field Diagnosis for Random Logic Circuits
复制标题
随机逻辑电路的结构现场诊断
DOI：
--
复制
发表时间：
2011
期刊：
影响因子：
--
通讯作者：
U. Abelein
中科院分区：
文献类型：
--
作者：
A. Cook;Melanie Elm;H. Wunderlich;U. Abelein
对于客户和系统集成商而言，汽车等大型系统中电子元件的现场可诊断性已成为必要条件。传统上，功能诊断应用于集成期间和现场故障或故障的车间。然而，功能诊断没有产生足够的覆盖范围，以允许在生产中的系统故障的短修复时间和快速反应。结构诊断可以产生所需的覆盖范围，但最近的内置架构，可以在现场重复使用，要么不揭示诊断信息或需要专门的测试方案。本文通过一种新的内置测试方法填补了这一空白，该方法用于自动现场测试和现场诊断数据收集。建议的内置自诊断方法（BISD）是基于标准的BIST架构，可以无缝集成与最近，商业DfT技术。与工业设计的实验表明，其开销是边际和结构诊断能力相媲美的高端测试设备上的外部诊断。
In-field diagnosability of electronic components in larger systems such as automobiles becomes a necessity for both customers and system integrators. Traditionally, functional diagnosis is applied during integration and in workshops for in-field failures or break-downs. However, functional diagnosis does not yield sufficient coverage to allow for short repair times and fast reaction on systematic failures in the production. Structural diagnosis could yield the desired coverage, yet recent built-in architectures which could be reused in the field either do not reveal diagnostic information or necessitate dedicated test schemes. The paper at hand closes this gap with a new built-in test method for autonomous in-field testing and in-field diagnostic data collection. The proposed Built-In Self-Diagnosis method (BISD) is based on the standard BIST architecture and can seamlessly be integrated with recent, commercial DfT techniques. Experiments with industrial designs show that its overhead is marginal and its structural diagnostic capabilities are comparable to those of external diagnosis on high-end test equipment.