An improved X-ray diffraction method for cellulose crystallinity measurement
An improved X-ray diffraction method for cellulose crystallinity measurement
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DOI:
10.1016/j.carbpol.2014.12.071
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发表时间:
2015-06-05
影响因子:
11.2
通讯作者:
Zhang, Xiao
中科院分区:
文献类型:
--
作者:
Ju, Xiaohui;Bowden, Mark;Zhang, Xiao
We show in this work a modified X-ray diffraction method to determine cellulose crystallinity index (Crl). Nanocrystalline cellulose (NCC) derived from bleached wood pulp was used as a model substrate. Rietveld refinement was applied with consideration of March-Dollase preferred orientation at the (001) plane. In contrast to most previous methods, three distinct amorphous peaks identified from new model samples which used to calculate Crl. A 2 theta range from 10 degrees to 75 degrees was found to be more suitable to determine Crl and crystallite structural parameters such as d-spacing and crystallite size. This method enables a more reliable measurement of Crl of cellulose and may be applicable to other types of cellulose polymorphs. (C) 2015 Elsevier Ltd. All rights reserved.