Three-dimensional Fermi surface determination by angle-resolved photoelectron spectroscopy -: art. no. 125104
Three-dimensional Fermi surface determination by angle-resolved photoelectron spectroscopy -: art. no. 125104
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DOI：
10.1103/physrevb.63.125104
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发表时间：
2001-03-15
影响因子：
3.7
通讯作者：
Pollmann, J
中科院分区：
文献类型：
--
作者：
Rossnagel, K;Kipp, L;Pollmann, J
角分辨光电子能谱（ARPES）通常用于绘制费米曲面的形状。在这里，我们量化了由强变化矩阵元素诱导的ARPES提取费米矢量的简单准则的误差。以准二维系统1 T-TiTe2的数据为参考，讨论了基于温度和光子能量依赖的光发射来确定三维费米维数的复杂方法。
Angle-resolved photoelectron spectroscopy (ARPES) is commonly applied to map the shape of Fermi surfaces. Here we quantify the errors of simple criteria for extracting Fermi vectors by ARPES that are induced by strongly varying matrix elements. Sophisticated methods for determining the three-dimensional Fermi victor based on temperature and photon energy dependent photoemission are discussed with reference to data of the quasi-two-dimensional system 1 T-TiTe2.