Stress and morphological development of CdS and ZnS thin films during the SILAR growth on (1 0 0)GaAs
Stress and morphological development of CdS and ZnS thin films during the SILAR growth on (1 0 0)GaAs
复制标题
DOI：
10.1016/s0169-4332(01)00775-9
复制
发表时间：
2001-12
影响因子：
6.7
通讯作者：
G. Laukaitis;S. Lindroos;S. Tamulevičius;M. Leskelä
中科院分区：
文献类型：
--
作者：
G. Laukaitis;S. Lindroos;S. Tamulevičius;M. Leskelä
