Point-contact spectroscopy of mutual REB6 (RE = La, Y, Sm, Ce) by automatic in situ cleaning
Point-contact spectroscopy of mutual REB6 (RE = La, Y, Sm, Ce) by automatic in situ cleaning
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通过自动原位清洗实现互 REB6（RE = La、Y、Sm、Ce）的点接触光谱
DOI：
10.1016/0304-8853(87)90700-1
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发表时间：
1987
期刊：
影响因子：
--
通讯作者：
S. Kunii
中科院分区：
文献类型：
--
作者：
S. Kunii
我们报告了对微分电阻dv/div的系统研究。RE=La，Y，Sm和Ce时，一侧REB6针与另一侧同一REB6(100)解理面之间的点接触的电压特性。足够干净和无障碍的点接触光谱与每对势垒型隧穿的结果相反。SmB6的能隙2Δ为16 meV。CeB6的近藤能隙2Δ为1.2 meV。
We report a systematic investigation of the differential resistance dV/dIvs. voltage characteristics of point-contacts between REB6-needle on one side and the same REB6(100)-cleavage surface on the other in which RE = La, Y, Sm and Ce. Enough clean and barrierless spectra of the point-contacts are contrary to the results of the barrier-type tunneling on every pair. The gap 2Δ of SmB6is 16 meV. The Kondo gap 2Δ of CeB6is 1.2 meV.