Nature of the well screened state in hard X-ray Mn 2p core-level photoemission measurements of La1-xSrxMnO3 films -: art. no. 236401
Nature of the well screened state in hard X-ray Mn 2p core-level photoemission measurements of La1-xSrxMnO3 films -: art. no. 236401
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DOI：
10.1103/physrevlett.93.236401
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发表时间：
2004-12-03
影响因子：
8.6
通讯作者：
Shin, S
中科院分区：
文献类型：
--
作者：
Horiba, K;Taguchi, M;Shin, S
使用硬X射线（HX; hnu=5.95 keV）的同步辐射光电子能谱（PES），研究了La_（1-x）Sr_xMnO_3（LSMO）薄膜的本征电子结构。Mn 2 p核能级与软X射线（SX; hnu类似于1000 eV）PES的比较表明，只有在HX PES中才有明显的额外的良好屏蔽特征。与起飞角有关的数据表明其体积（大于或等于20埃）特性。掺杂和温度依赖性跟踪的铁磁性和金属性的LSMO系列。团簇模型计算，包括从掺杂诱导状态的电荷转移显示出良好的一致性，证实了这张照片的散装性能反映在锰2 p核心水平，使用HX PES。
Using hard x-ray (HX; hnu=5.95 keV) synchrotron photoemission spectroscopy (PES), we study the intrinsic electronic structure of La1-xSrxMnO3 (LSMO) thin films. Comparison of Mn 2p core-levels with soft x-ray (SX; hnusimilar to1000 eV) PES shows a clear additional well-screened feature only in HX PES. Takeoff-angle dependent data indicate its bulk (greater than or equal to20 Angstrom) character. The doping and temperature dependence track the ferromagnetism and metallicity of the LSMO series. Cluster model calculations including charge transfer from doping-induced states show good agreement, confirming this picture of bulk properties reflected in Mn 2p core-levels using HX PES.