Dielectric spectroscopy of thin surface layer by Differential Time Domain Reflectometry using a Coplaner Waveguide Circuit line probe
Dielectric spectroscopy of thin surface layer by Differential Time Domain Reflectometry using a Coplaner Waveguide Circuit line probe
复制标题
使用共面波导电路线探头通过差分时域反射法测量薄表面层的介电谱
DOI：
10.1088/0957-0233/24/2/025501
复制
发表时间：
2013
影响因子：
2.4
通讯作者：
Jun Yamada
中科院分区：
文献类型：
--
作者：
Ryo Shirakashi;Tsuyoshi Ogawa;Jun Yamada
介电谱是测量各种材料，特别是软材料弛豫特性的有力方法。在这些软材料中，生命系统和人造多层膜具有厚度为纳米至微米量级的层状结构。为了测量这样的薄层的介电谱，用于介电谱的测量探针需要该结构具有与薄层的厚度相当的低测量深度。为此，我们开发了一种探头，用于测量不同深度的材料表面的介电谱，使用差分时域反射计。开发的探头由280 µm至1 mm线宽的共面波导电路组成，可测量厚度在450 µm至1.2 mm范围内的材料表面层的介电谱。测量探头的拟议结构可通过减小共面波导电路线的宽度和间距来实现较薄材料表面层的介电谱。
Dielectric spectroscopy is a powerful method for measuring the relaxation properties of various materials, especially soft materials. Among these soft materials, living systems and artificial multilayer films have layered structures with a thickness on the order of nano-to micrometers. To measure the dielectric spectra of such a thin layer, the measurement probe for dielectric spectroscopy requires the structure to possess a low measurement depth that is comparable to the thickness of the thin layer. For this purpose, we developed a probe for measuring the dielectric spectra of material surfaces of various depths using differential time-domain reflectometry. The developed probes consist of coplanar waveguide circuits of 280 µm to 1 mm line width, which allows for the measurement of the dielectric spectra of the material surface layer with thicknesses in the range of 450 µm to 1.2 mm. The proposed structure of the measurement probe enables the dielectric spectroscopy of a thinner material surface layer by reducing the width and pitch of the coplanar waveguide circuit lines.