Detecting Laser Fault Injection Attacks via Time-to-Digital Converter Sensors

Detecting Laser Fault Injection Attacks via Time-to-Digital Converter Sensors
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通过时间数字转换器传感器检测激光故障注入攻击

DOI:
10.1109/host54066.2022.9840318
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发表时间:
2022
期刊:
2022 IEEE International Symposium on Hardware Oriented Security and Trust (HOST)
影响因子:
--
通讯作者:
Naghmeh Karimi
Naghmeh Karimi
中科院分区:
--
文献类型:
--
作者:
Mohammad Ebrahimabadi;Suhee Sanjana Mehjabin;R. Viera;S. Guilley;J. Danger;J. Dutertre;Naghmeh Karimi

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近年来,故障注入攻击(FIA)受到了广泛的关注。攻击者发起这样的攻击是为了滥用对系统的控制或泄露敏感数据。激光照明被认为是一种有效的FIA发射技术。基于激光的FIA主要用于当对手选择瞄准目标电路中的特定位置时。然而,由于晶体管的小型化和朝着更小的特征尺寸发展,即使是小的激光光斑也可以照亮多个栅极;当电路配备有嵌入式故障检测机制(如数字传感器)时,攻击更容易被检测到。在本文中,我们使用时间数字转换器,又名数字传感器,来检测激光射击。我们表明,通过将这些数字传感器嵌入到目标电路中,可以高精度地感测由激光照射引起的IR降。当检测到故障时,将发出警报。仿真结果表明,该方案在检测激光FIA中具有较高的精度。
Fault Injection Attacks (FIA) have received a lot of attention in recent years. An adversary launches such an attack to abusively take control over the system or to leak sensitive data. Laser illumination has been considered as an effective technique to launch FIA. The laser-based FIAs are mainly used when the adversary opts to target a specific location in the target circuit. However, thanks to the miniaturization of transistors and moving towards smaller feature size, even small laser spots may illuminate more than one gate; making the attack more detectable when the circuitries are equipped with embedded fault detection mechanisms such as digital sensors. In this paper, we use time-to-digital convertors, aka digital sensors, to detect the laser shots. We show that by embedding these digital sensors in the target circuitry, the IR drop caused by the laser illumination can be sensed with a high accuracy. An alarm will be raised when the fault is detected. The simulation results show the high accuracy of the proposed scheme in detecting laser-based FIAs.
DOI: 10.1007/s10836-021-05976-8
发表时间: 2021-12
期刊: Journal of Electronic Testing
影响因子: --
作者:
Md Toufiq Hasan Anik;Mohammad Ebrahimabadi;J. Danger;S. Guilley;Naghmeh Karimi
通讯作者: Md Toufiq Hasan Anik;Mohammad Ebrahimabadi;J. Danger;S. Guilley;Naghmeh Karimi