Atomic Force Microscopy: A New Look at Pathogens
Atomic Force Microscopy: A New Look at Pathogens
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DOI:
10.1371/journal.ppat.1003516
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发表时间:
2013-09-01
期刊:
影响因子:
6.7
通讯作者:
Dufrene, Yves F.
中科院分区:
文献类型:
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作者:
Alsteens, David;Beaussart, Audrey;Dufrene, Yves F.