The formation of nanometer-scale gaps by electrical degradation and their application to C 60 transport measurements
The formation of nanometer-scale gaps by electrical degradation and their application to C 60 transport measurements
复制标题
电降解形成纳米级间隙及其在 C 60 输运测量中的应用
DOI：
10.1016/j.mee.2004.03.035
复制
发表时间：
2004
影响因子：
2.3
通讯作者：
Y. Aoyagi
中科院分区：
文献类型：
--
作者：
K. Tsukagoshi;E. Watanabe;I. Yagi;Y. Aoyagi
