Nanomanipulation and electrical behaviour of a single gold nanowire using in-situ SEM-FIB-nanomanipulators
Nanomanipulation and electrical behaviour of a single gold nanowire using in-situ SEM-FIB-nanomanipulators
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使用原位 SEM-FIB 纳米操纵器对单根金纳米线进行纳米操纵和电学行为
DOI:
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发表时间:
2008
期刊:
影响因子:
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通讯作者:
B. Inkson
中科院分区:
文献类型:
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作者:
Yong Peng;I. Luxmoore;M. Forster;A. Cullis;B. Inkson
Gold nanowires were successfully fabricated by a DC electrodeposition technique into Anodic Aluminium Oxide (AAO) templates. The microstructure of 55nm gold nanowires released from AAO templates was observed by SEM and TEM to be polycrystalline, with a bamboo-type structure and grain sizes 20nm to several micrometers. Individual gold nanowires were picked up from bundles of gold nanowires using a super-sharp W tip attached to an in-situ Kleindiek nanomanipulator fitted in a SEM-FIB. The picked-up gold nanowires were then deposited onto a silicon wafer, or connected between two nanomanipulator tips, to fabricate single nanowire nano-circuits for electrical testing. The electrical properties of single manipulated nanowires are compared to that of bundles of gold nanowires for the two circuit types. The lowest resistance is achieved by connecting the gold nanowires between two FIB-milled tungsten tips.