A new parafocusing paradigm for X-ray diffraction.
A new parafocusing paradigm for X-ray diffraction.
复制标题
X 射线衍射的新顺焦范例。
DOI：
10.1107/s1600576720008651
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发表时间：
2020
影响因子：
6.1
通讯作者：
Prokopiou D
中科院分区：
文献类型：
--
作者：
Prokopiou D
本文首次提出了一种利用环形入射光束实现x射线共聚焦衍射的新方法。该方法利用平坦样品上的椭圆试样路径来产生可以用点检测器测量的相对较高的强度最大值。结果表明，传统的布拉格-布伦塔诺几何所容忍的平面试样近似是不需要的。给出了角色散和能量色散测量模式的理论框架、仿真和实验结果，并将散射特征与传统铅笔束布置的数据进行了比较。
A new approach to parafocusing X-ray diffraction implemented with an annular incident beam is demonstrated for the first time. The method exploits an elliptical specimen path on a flat sample to produce relatively high intensity maxima that can be measured with a point detector. It is shown that the flat-specimen approximation tolerated by conventional Bragg–Brentano geometries is not required. A theoretical framework, simulations and experimental results for both angular- and energy-dispersive measurement modes are presented and the scattering signatures compared with data obtained with a conventional pencil-beam arrangement.