Improved process for the TlBr single-crystal detector
Improved process for the TlBr single-crystal detector
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DOI:
10.1016/j.nima.2008.03.058
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发表时间:
2008-06
影响因子:
1.4
通讯作者:
V. Kozlov;H. Andersson;V. Gostilo;M. Leskelä;A. Owens;M. Shorohov;H. Sipila
中科院分区:
文献类型:
--
作者:
V. Kozlov;H. Andersson;V. Gostilo;M. Leskelä;A. Owens;M. Shorohov;H. Sipila
The combination of Bridgman, recrystallization by dissolving in pure water under hydrothermal conditions and travelling molten zone (TMZ) methods were used for TlBr purification. Detectors of 0.5 and 3mm thickness were produced from a single crystal grown by the TMZ method. The samples had stable spectrometric characteristics from −40°C to room temperature. A resolution of 3.7% at 60keV (241Am source) was attained for 3-mm sample at 0°C. Electrical and spectroscopic properties of the detectors are reported and discussed.