A Generalized Binomial Group Testing Problem

A Generalized Binomial Group Testing Problem
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广义二项式群测试问题

DOI:
10.1080/01621459.1975.10480324
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发表时间:
1975
影响因子:
3.7
通讯作者:
F. Hwang
F. Hwang
中科院分区:
数学1区
文献类型:
--
作者:
F. Hwang

文献摘要

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考虑n个随机独立单元的总体,其中单元i有缺陷的概率pi。广义二项式成组测试问题是通过一系列成组测试来找出所有有缺陷的单元。Dorfman过程被定义为将所有单元划分为任意数量的不相交组,以便对每个单元进行组测试。如果一个组有缺陷,那么其中的每个单元都要单独测试。在这篇文章中,我们给出了一个有效的动态规划算法,以获得一个最佳的Dorfman过程的GBGT问题有限n。
Abstract Considera population of n stochastically independent units where unit i has probability p i of being defective. The generalized binomial group testing (GBGT) problem is to find all the defective units by means of a sequence of group tests. A Dorfman procedure is defined to be a partition of all units into any number of disjoint groups such that a group test is performed on each of them. If a group is defective, then every unit in it is tested individually. In this article we give an efficient dynamic programming algorithm to obtain an optimal Dorfman procedure for the GBGT problem with finite n.