Optical image amplification in dual-comb microscopy
Optical image amplification in dual-comb microscopy
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DOI：
10.1038/s41598-020-64927-z
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发表时间：
2020-05-20
影响因子：
4.6
通讯作者：
Yasui, Takeshi
中科院分区：
文献类型：
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作者：
Mizuno, Takahiko;Tsuda, Takuya;Yasui, Takeshi
双梳显微术（DCM）是一种基于双梳光谱（DCS）和二维光谱编码（2D-SE）相结合的无扫描共焦激光显微术，具有振幅和相位的共焦特性。然而，2D-SE光学系统中的信号损失由于降低的信噪比而阻碍了图像获取速率的增加。在这篇文章中，我们演示了在DCM与掺铒光纤放大器（EDFA）的光学图像放大。图像编码的DCS干涉图和EDFA的组合使用不仅受益于振幅和相位图像的批量放大，而且还显著抑制放大的自发辐射（ASE）背景。光学图像放大DCM的有效性突出在单次拍摄定量纳米级表面形貌和水对流下的聚苯乙烯珠动态的实时电影。该方法将是一个强有力的工具，实时观察表面形貌和快速动态现象。
Dual-comb microscopy (DCM), based on a combination of dual-comb spectroscopy (DCS) with two-dimensional spectral encoding (2D-SE), is a promising method for scan-less confocal laser microscopy giving an amplitude and phase image contrast with the confocality. However, signal loss in a 2D-SE optical system hampers increase in image acquisition rate due to decreased signal-to-noise ratio. In this article, we demonstrated optical image amplification in DCM with an erbium-doped fiber amplifier (EDFA). Combined use of the image-encoded DCS interferogram and the EDFA benefits from not only the batch amplification of amplitude and phase images but also significant rejection of amplified spontaneous emission (ASE) background. Effectiveness of the optical-image-amplified DCM is highlighted in the single-shot quantitative nanometer-order surface topography and the real-time movie of polystyrene beads dynamics under water convection. The proposed method will be a powerful tool for real-time observation of surface topography and fast dynamic phenomena.