TRACE CHEMICAL VAPOR DETECTION USING SAW DELAY-LINE OSCILLATORS
TRACE CHEMICAL VAPOR DETECTION USING SAW DELAY-LINE OSCILLATORS
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DOI:
10.1109/t-uffc.1987.26929
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发表时间:
1987-03-01
影响因子:
3.6
通讯作者:
BALLANTINE, DS
中科院分区:
文献类型:
--
作者:
WOHLTJEN, H;SNOW, AW;BALLANTINE, DS
The resonant frequencies of SAW delay line oscillators are shown to be very sensitive to the presence of thin organic films that are deposited onto the delay line surface. Theory suggests that the sensitivity of the SAW device to mass loading depends on the square of the resonant frequency. This dependence has been studied experimentally using devices resonating at 31, 52, and 112 MHz that were coated with organic films of precisely controlled composition and thickness. The mass sensitivity of SAW oscillators can be exploited to make very sensitive chemical sensors if an appropriate sorptive coating is applied to the device. Results obtained from a SAW delay line oscillator operating at 290 MHz (the highest frequency SAW chemical sensor reported to date) suggest that the rapid detection of organic vapors at concentrations substantially below 100 parts per billion (by volume) is readily achievable.