Whether “Rich in Frequency” Means “Rich in Information” in Pulsed Eddy Current Testing to Evaluate Plate Thickness: Numerical Investigation
Whether “Rich in Frequency” Means “Rich in Information” in Pulsed Eddy Current Testing to Evaluate Plate Thickness: Numerical Investigation
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DOI：
10.2320/matertrans.mt-i2021001
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发表时间：
2022-04
影响因子：
1.2
通讯作者：
N. Yusa;Jiuhao Ge;Mengbao Fan
中科院分区：
文献类型：
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作者：
N. Yusa;Jiuhao Ge;Mengbao Fan
