Keynote Lecture: Residual Stress Gradient Analysis by Multiple Diffraction Line Methods
Keynote Lecture: Residual Stress Gradient Analysis by Multiple Diffraction Line Methods
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DOI：
10.4028/www.scientific.net/msf.768-769.3
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发表时间：
2013-09
期刊：
影响因子：
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通讯作者：
C. Genzel;D. Apel;M. Klaus;Martin Genzel;D. Balzar
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文献类型：
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作者：
C. Genzel;D. Apel;M. Klaus;Martin Genzel;D. Balzar
本文讨论了x射线应力分析（XSA）方法，该方法允许在拉普拉斯空间和实空间中分别评估近表面平面内残余应力梯度σ||（τ）和σ||(z)。由于残余应力梯度分析的“鲁棒性”在很大程度上取决于测量应变数据的质量和实验数据点的数量，因此讨论的目标是那些基于处理各种衍射线甚至完整衍射图案的方法。结果表明，这些最初用于角色散（AD）衍射的技术可以应用于高能同步辐射的能量色散（ED）衍射。以喷丸铁素体钢为例，证明了利用ED衍射技术在XSA Ψ-mode中测量的sin²ψ-数据可以在不同近似水平上进行分析。
The paper deals with methods for X-ray stress analysis (XSA), which allow for the evaluation of near surface in-plane residual stress gradients σ||(τ) and σ||(z) in the LAPLACE- and the real space, respectively. Since the ‘robustness’ of residual stress gradient analysis strongly depends on both, the quality of the measured strain data and the number of experimental data points, the discussion aims at those approaches which are based on processing various diffraction lines or even complete diffraction patterns. It is shown that these techniques, which were originally developed for angle-dispersive (AD) diffraction, can be adapted and enhanced for energy-dispersive (ED) diffraction employing high-energy synchrotron radiation. With the example of a shot-peened ferritic steel it is demonstrated, that sin²ψ-data measured in the Ψ-mode of XSA employing the ED diffraction technique can be analyzed on different levels of approximation.