Test of ATLAS SCT barrel modules with Nd:YAG laser

Test of ATLAS SCT barrel modules with Nd:YAG laser
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DOI：
10.1016/j.nima.2005.01.048
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发表时间：
2005-04
期刊：
Nuclear Instruments & Methods in Physics Research Section A-accelerators Spectrometers Detectors and Associated Equipment
影响因子：
1.4
通讯作者：
K. Hara;M. Minagawa;T. Kuwano;K. Nakamura;Y. Nakamura;H. Sengoku;Y. Ikegami;T. Kohriki;T. Kondo;S. Terada;Y. Unno;R. Takashima;I. Nakano;R. Tanaka;Y. Iwata;T. Ohsugi
K. Hara;M. Minagawa;T. Kuwano;K. Nakamura;Y. Nakamura;H. Sengoku;Y. Ikegami;T. Kohriki;T. Kondo;S. Terada;Y. Unno;R. Takashima;I. Nakano;R. Tanaka;Y. Iwata;T. Ohsugi
中科院分区：
物理与天体物理3区
文献类型：
--
作者：
K. Hara;M. Minagawa;T. Kuwano;K. Nakamura;Y. Nakamura;H. Sengoku;Y. Ikegami;T. Kohriki;T. Kondo;S. Terada;Y. Unno;R. Takashima;I. Nakano;R. Tanaka;Y. Iwata;T. Ohsugi

文献摘要

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作为 ATLAS SCT（半导体跟踪器）筒模块质量保证程序的一部分，微带探测器的响应是通过在每个带上注入聚焦 Nd:YAG 激光来测量的。该测试对传感器引起的问题非常敏感，并且会交叉检查使用读出 ASIC 中实现的测试脉冲系统执行的电气测试所获得的结果。结合这些结果与硅传感器制造商获得的探测结果，我们验证了这些测试的可靠性，并对缺陷类型进行了分类，以评估模块的整体性能。
As a part of the quality assurance procedure of the ATLAS SCT (Semiconductor Tracker) barrel modules, the response of the microstrip detector is measured by injecting focused Nd:YAG laser at each strip. The test is sensitive to sensor originated problems and a cross check to the results obtained from the electrical tests performed with the test pulse system implemented in the readout ASICs. Combining these results with the probing results obtained by the silicon sensor manufacturer, we verified the reliabilities of these tests and classified the type of defects for overall performance evaluation of the modules.