Heavy-fermion behavior in cerium-based metallic glasses
Heavy-fermion behavior in cerium-based metallic glasses
复制标题
铈基金属玻璃中的重费米子行为
DOI：
10.1103/physrevb.75.172201
复制
发表时间：
2007-05
影响因子：
3.7
通讯作者：
Winzer, K.
中科院分区：
文献类型：
--
作者：
Bogdanov, D.;Tang, M. B.;Wang, W. H.;Egami, T.;Bai, H. Y.;Samwer, K.;Winzer, K.
用200 kV高分辨电子显微镜（点分辨率为0.2 nm）研究了生长在Si衬底（001）面上的3C-SiC薄膜中的缺陷。结合图像对比度分析，使用后验图像处理技术，图像去卷积，以在[110]投影图像中区分彼此相距0.109 nm的Si原子和C原子。简要介绍了所采用的图像处理技术的原理和相关的图像对比度理论。介绍了将不能直观反映晶体结构的实验图像转换成结构图以及从结构图中识别Si和C原子的过程。在原子水平上导出了30度部分位错和微孪晶的原子组态。确定了30度部分位错终止于C原子，微孪晶段夹在两个180度旋转孪晶之间。根据30度部分位错和微孪晶的恢复结构图，导出了相应的堆垛序列，并建立了相应的原子模型。基于这两种模型对图像进行了仿真，验证了上述结果。
The defects in 3C-SiC film grown on (001) plane of Si substrate were studied using a 200 kV high-resolution electron microscope with point resolution of 0.2 nm. A posterior image processing technique, the image deconvolution, was utilized in combination with the image contrast analysis to distinguish atoms of Si from C distant from each other by 0.109 nm in the [110] projected image. The principle of the image processing technique utilized and the related image contrast theory is briefly presented. The procedures of transforming an experimental image that does not reflect the crystal structure intuitively into the structure map and of identifying Si and C atoms from the map are described. The atomic configurations for a 30 degrees partial dislocation and a microtwin have been derived at atomic level. It has been determined that the 30 degrees partial dislocation terminates in C atom and the segment of microtwin is sandwiched between two 180 degrees rotation twins. The corresponding stacking sequences are derived and atomic models are constructed according to the restored structure maps for both the 30 degrees partial dislocation and microtwin. Images were simulated based on the two models to affirm the above-mentioned results.
DOI：
10.1201/9781482295191
发表时间：
1993-05
期刊：
--
影响因子：
--
作者：
J. Mydosh
通讯作者：
J. Mydosh