Single crystal X-ray diffraction study of MgSiO3 perovskite from 77 to 400 K
Single crystal X-ray diffraction study of MgSiO3 perovskite from 77 to 400 K
复制标题
DOI:
10.1007/bf00197010
复制
发表时间:
1989-04
影响因子:
1.4
通讯作者:
N. Ross;R. Hazen
中科院分区:
文献类型:
--
作者:
N. Ross;R. Hazen
Single crystal X-ray diffraction study of MgSiO3perovskite has been completed from 77 to 400 K. The thermal expansion coefficient between 298 and 381 K is 2.2(8) × 10-5K-1. Above 400 K, the single crystal becomes so multiply twinned that the cell parameters can no longer be determined.From 77 to 298 K, MgSiO3perovskite has an average thermal expansion coefficient of 1.45(9) × 10-5K-1, which is consistent with theoretical models and perovskite systematics. The thermal expansion is anisotropic; the a axis shows the most expansion in this temperature range (αa= 8.4(9) × 10-6K-1) followed by c(αc= 5.9(5) × 10-6K-1) and then by b, which shows no significant change in this temperature range. In addition, the distortion (i.e., the tilting of the [SiO6] octahedra) decreases with increasing temperature. We conclude that the behavior of MgSiO3perovskite with temperature mirrors its behavior under compression.