An Evolutionary Negative-Correlation Framework for Robust Analog-Circuit Design Under Uncertain Faults
An Evolutionary Negative-Correlation Framework for Robust Analog-Circuit Design Under Uncertain Faults
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DOI：
10.1109/tevc.2012.2228208
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发表时间：
2013-10
影响因子：
14.3
通讯作者：
Mingguo Liu;Jingsong He
中科院分区：
文献类型：
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作者：
Mingguo Liu;Jingsong He
在恶劣环境中工作的电子系统可能会发生不确定和不可预测的故障。模拟电路在现代电子系统中起着重要的作用。因此，研究模拟电路在不确定故障下的可靠性具有重要意义。对于设计为容忍某些故障的鲁棒模拟电路，意外故障可能会产生很大的影响。为了提高模拟电路对意外故障和不确定故障的鲁棒性，提出了一种新的模拟电路冗余度演化方法。提出了一个进化负相关框架来进化负相关冗余。实验研究提供了观察的原因，所提出的框架是能够发展负相关的结果。在第四节中，我们实现了各种故障模拟统计测试和评估的容错性能的不确定性故障下提出的负相关冗余。实验结果表明，负相关冗余在两个方面显著提高了不确定性故障环境下模拟电路的容错性能：1）在各种故障模拟后，负相关冗余在统计评估中的性能下降较小; 2）在不可预测故障面前，负相关冗余具有更好的稳定性。一个重要的改进是，负相关冗余电路对各种不确定故障具有更突出的鲁棒性比模拟电路设计的某些故障。因此，该方法是一种很有前途的模拟电路设计方法。
Uncertain and unpredictable faults can occur in electronic systems that work in harsh environments. Analog circuits play an important part in modern electronic systems. Accordingly, it is important to investigate the reliability of analog circuits under uncertain faults. For robust analog circuits designed to be tolerant of certain faults, unexpected faults might issue great influence. For the enhancement of analog circuits' robustness generalization on unexpected and uncertain faults, this paper presents a new idea to evolve analog redundancies that are negatively correlated. An evolutionary negative-correlation framework is proposed to evolve negatively correlated redundancies. An experimental study is provided to observe the reason why the proposed framework is able to evolve negatively correlated results. In Section IV, we implement various fault simulations to statistically test and evaluate the fault-tolerant performance of the proposed negatively correlated redundancies under uncertain faults. Experimental results show that negatively correlated redundancies significantly improve the analog circuit's fault-tolerant performance under uncertain-fault environments in two aspects: 1) negatively correlated redundancies have lower performance degradation in the statistical evaluation after various fault simulations, and 2) negatively correlated redundancies have better stability in the face of unpredictable faults. A significant improvement is that negatively correlated redundancies have more outstanding robustness on various uncertain faults than analog circuits that are designed for certain faults. By this token, the proposed idea can be a promising way of robust analog circuit design for uncertain-fault environments.