Nondestructive elemental depth profiling of Japanese lacquerware ‘Tamamushi‐nuri’ by confocal 3D‐XRF analysis in comparison with micro GE‐XRF

Nondestructive elemental depth profiling of Japanese lacquerware ‘Tamamushi‐nuri’ by confocal 3D‐XRF analysis in comparison with micro GE‐XRF
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DOI:
10.1002/xrs.1163
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发表时间:
2009-09
期刊:
影响因子:
1.2
通讯作者:
K. Nakano;K. Tsuji
K. Nakano;K. Tsuji
中科院分区:
物理与天体物理4区
文献类型:
--
作者:
K. Nakano;K. Tsuji

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我们最近将两种XRF(微x射线荧光)方法[微放牧出口XRF (GE-XRF)和共聚焦3D-XRF]应用于日本漆器“Tamamushi-nuri”。实验室放牧出口XRF (GE-XRF)仪器与微型XRF装置相结合。微x射线束是由一个毛细管和一个针孔孔径产生的。显微GE-XRF在不同分析深度下获得了元素x射线图像(二维图像)。然而,直接获得深度选择x射线光谱和二维图像是困难的。使用两个独立的多毛细x射线透镜和两个x射线源(Cr和Mo靶)的3D XRF仪器也应用于同一样品。日本漆器的二维XRF图像显示了元素在不同深度的特定分布,表明“Tamamushi-nuri”漆器具有分层结构。讨论了微型GE-XRF和共聚焦微型XRF方法的优缺点。版权所有©2009 John Wiley & Sons, Ltd
We have applied recently two XRF (micro x-ray fluorescence) methods [micro-Grazing Exit XRF (GE-XRF) and confocal 3D-XRF] to Japanese lacquerware ‘Tamamushi-nuri.’ A laboratory grazing-exit XRF (GE-XRF) instrument was developed in combination with a micro-XRF setup. A micro x-ray beam was produced by a single capillary and a pinhole aperture. Elemental x-ray images (2D images) obtained at different analyzing depths by micro GE-XRF have been reported. However, it was difficult to directly obtain depth-selective x-ray spectra and 2D images. A 3D XRF instrument using two independent polycapillary x-ray lenses and two x-ray sources (Cr and Mo targets) was also applied to the same sample. 2D XRF images of a Japanese lacquerware showed specific distributions of elements at the different depths, indicating that ‘Tamamushi-nuri’ lacquerware has a layered structure. The merits and disadvantages of both the micro GE-XRF and confocal micro XRF methods are discussed. Copyright © 2009 John Wiley & Sons, Ltd.