An early prediction methodology for aging sensor insertion to assure safe circuit operation due to NBTI aging
An early prediction methodology for aging sensor insertion to assure safe circuit operation due to NBTI aging
复制标题
老化传感器插入的早期预测方法，以确保由于 NBTI 老化而导致的电路安全运行
DOI：
10.1109/vts.2015.7116290
复制
发表时间：
2015
期刊：
影响因子：
--
通讯作者：
V. Champac
中科院分区：
文献类型：
--
作者：
Andres F. Gomez;L. Poehls;F. Vargas;V. Champac
本文提出了一种早期弹性的方法来确定电路输出节点，老化的传感器应插入错误预测框架。该方法是基于预布局的信号路径的统计估计可能成为关键由于NBTI和/或工艺变化。为了处理空间相关性信息在设计流程的早期阶段不可用的事实，提出了一种最大化关键路径覆盖的统计方法。与早期预测方法获得的结果进行了比较与空间相关信息。所提出的方法提供了一个很好的预测的一组关键路径进行监测。此外，位置和数量的老化传感器需要插入在关键路径输出节点密切预测。
This paper proposes an early resilience methodology to identify circuit output nodes where aging sensors should be inserted for an error prediction framework. The methodology is based in a pre-layout statistical estimation of the signal paths likely to become critical due to NBTI and/or Process Variations. To handle the fact that spatial correlation information is not available at early steps of the design flow, a statistical approach maximizing critical paths coverage is proposed. The results obtained with the early prediction methodology are compared with those obtained with spatial correlation information. The proposed methodology provides a good prediction of the set of critical paths to be monitored. Furthermore, location and number of aging sensors required to be inserted at critical paths output nodes are closely predicted.