On a generalized test sequencing problem
On a generalized test sequencing problem
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关于广义测试排序问题
DOI：
10.1109/21.148415
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发表时间：
1992
期刊：
影响因子：
--
通讯作者：
M. Dontamsetty
中科院分区：
文献类型：
--
作者：
K. Pattipati;M. Dontamsetty
系统现场维护中诊断的主要重点是识别故障模块，而不是模块中的单个故障。此外，诊断通常与两种类型的修复相结合：类型1修复，其中在完全诊断后修复模块；以及类型2修复，其中在部分诊断后替换被怀疑有故障的模块。考虑了在具有类型1和类型2维修选项的模块化系统中，构造最优和次最优测试序列来诊断故障的问题。给出了该广义测试排序问题的动态规划递推公式，并基于信息论给出了最优费用下界。这些界确保了通过AND/OR图启发式搜索过程找到最优测试算法。它说明了如何将类型2修复与诊断相结合，以减少预期的测试时间。>；
The primary focus of diagnosis in field maintenance of systems is to identify the faulty modules rather than the individual faults within the modules. In addition, diagnosis is often integrated with two types of repair: type 1 repair wherein a module is repaired after complete diagnosis, and a type 2 repair wherein a module suspected to be faulty is replaced after partial diagnosis. The problem of constructing optimal and suboptimal test sequences to diagnose faults in modular systems with type 1 and type 2 repair options is considered. Dynamic programming recursion for this generalized test sequencing problem is derived, and lower bounds on the optimal cost-to-go based on information theory are derived. These bounds ensure that an optimal test algorithm is found by AND/OR graph heuristic search procedures. It is illustrated how type 2 repair can be profitably combined with diagnosis to reduce the expected test time. >