Proton microbeams, their production and use
Proton microbeams, their production and use
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质子微束、其生产和使用
DOI：
10.1007/bf02520973
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发表时间：
1972
期刊：
影响因子：
--
通讯作者：
F. D. Pilling
中科院分区：
文献类型：
--
作者：
J. Cookson;A. Ferguson;F. D. Pilling
聚焦良好的质子束和其他离子束提供了一种非常强大的手段来确定样品表面的元素组成如何变化。在大多数情况下，对质子轰击产生的X射线的观测可以提供很高的灵敏度，而对核效应的探测则特别适用于低原子量的元素。设计并制造了一个用于IBIS 3 MeV货车德格拉夫发生器的高精度磁四极聚焦系统。一阶聚焦和像差的测量结果与理论预测一致。经测量，聚焦后的3MeV质子束直径小于4 μm。文中介绍了靶室、偏转系统和显示系统，并给出了该系统的使用实例。讨论了X射线检测的背景，并给出了检测极限。
Well focused beams of protons and other ions provide a very powerful means of determining how the elemental composition of a sample varies over its surface. Observation of the X-rays from proton bombardment can provide great sensitivity in most cases, while detection of nuclear effects has special applicability for elements of low atomic weight. A focusing system using high precision magnetic quadrupoles was designed and built for use with the IBIS 3 MeV Van de Graaff generator. Measurements of the first order focusing and aberrations agreed satisfactorily with theoretical predictions. The focused beam of 3 MeV protons was measured to have a diameter of less than 4 μm. The target chamber, deflection system and display system are described and examples given of use of the system. Backgrounds in X-ray detection are discussed and limits of detection are given.