Fourier optics modelling of instrument response for interference microscopy
Fourier optics modelling of instrument response for interference microscopy
复制标题
干涉显微镜仪器响应的傅里叶光学建模
DOI:
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复制
发表时间:
2020
期刊:
影响因子:
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通讯作者:
X. Colonna de Lega
中科院分区:
文献类型:
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作者:
P. D. de Groot;X. Colonna de Lega
Interferometers for the measurement of topography rely on imaging systems to map surface points to a camera. The response of an interferometer to variations in surface height depends on the filtering properties of the imaging system. Here we provide a simple and practical model of an imaging interferometer using classical Fourier optics, including the effects of partial coherence. The model is useful for understanding basic properties such as lateral resolution and error sources related to measurement principles that make assumptions regarding the fidelity of the instrument response over a range of surface spatial frequencies and light source wavelengths.
DOI:
10.1117/12.2526015
发表时间:
2019-06
期刊:
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影响因子:
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作者:
Matthew Thomas;Rong Su;N. Nikolaev;J. Coupland;R. Leach
通讯作者:
Matthew Thomas;Rong Su;N. Nikolaev;J. Coupland;R. Leach