Fourier optics modelling of instrument response for interference microscopy

Fourier optics modelling of instrument response for interference microscopy
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干涉显微镜仪器响应的傅里叶光学建模

DOI:
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发表时间:
2020
期刊:
Optical Engineering + Applications
影响因子:
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通讯作者:
X. Colonna de Lega
X. Colonna de Lega
中科院分区:
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文献类型:
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作者:
P. D. de Groot;X. Colonna de Lega

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测量地形的干涉仪依靠成像系统将表面点映射到相机上。干涉仪对表面高度变化的响应取决于成像系统的过滤特性。在这里,我们提供了一个简单实用的成像干涉仪模型,利用经典的傅里叶光学,包括部分相干的影响。该模型有助于理解与测量原理有关的基本属性,例如横向分辨率和误差源,这些测量原理对仪器响应在一系列表面空间频率和光源波长上的保真度做出假设。
Interferometers for the measurement of topography rely on imaging systems to map surface points to a camera. The response of an interferometer to variations in surface height depends on the filtering properties of the imaging system. Here we provide a simple and practical model of an imaging interferometer using classical Fourier optics, including the effects of partial coherence. The model is useful for understanding basic properties such as lateral resolution and error sources related to measurement principles that make assumptions regarding the fidelity of the instrument response over a range of surface spatial frequencies and light source wavelengths.
DOI: 10.1117/12.2526015
发表时间: 2019-06
期刊: --
影响因子: --
作者:
Matthew Thomas;Rong Su;N. Nikolaev;J. Coupland;R. Leach
通讯作者: Matthew Thomas;Rong Su;N. Nikolaev;J. Coupland;R. Leach