Spotting the differences in two-dimensional materials – the Raman scattering perspective
Spotting the differences in two-dimensional materials – the Raman scattering perspective
复制标题
发现二维材料的差异 - 拉曼散射视角
DOI:
10.1039/c7cs00874k
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发表时间:
2018
影响因子:
46.2
通讯作者:
Tong Lianming
中科院分区:
文献类型:
--
作者:
Zhang Shishu;Zhang Na;Zhao Yan;Cheng Ting;Li Xiaobo;Feng Rui;Xu Hua;Liu Zhirong;Zhang Jin;Tong Lianming
Two-dimensional (2D) layered materials have attracted tremendous attention and led to a prosperous development in both fundamental investigation and device applications in various fields, such as nanoelectronics, flexible devices, sustainable energy and catalysts. The precise characterization of the structure and properties of 2D materials is in urgent need. Raman scattering spectroscopy is one of the most popular characterization tools that is convenient, rapid and non-invasive. It provides information on both the lattice structure from the frequency of phonon modes and the electronic band structure through the intensity due to electronic resonance Raman scattering. Although a few morphological characterization tools can image 2D materials with atomic resolution, Raman scattering measurements are more tolerant to the conditions of sample preparation such as the substrate and less technically demanding, and have been one of the routine tools for the characterization of 2D materials. In this review, we focus on the characterization of 2D materials using Raman scattering spectroscopy, in particular, the revealing of differences from primitive 2D materials, such as defects, doping effects, van der Waals heterostructures and the interaction with molecules. The characteristic Raman features of such differences and the corresponding interpretation will be discussed. We hope that this review will be useful for wide research communities of materials, physics, chemistry and engineering.