Direct measurement of standing evanescent waves with a photon-scanning tunneling microscope.
Direct measurement of standing evanescent waves with a photon-scanning tunneling microscope.
复制标题
使用光子扫描隧道显微镜直接测量驻逝波。
作者：
A. J. Meixner;M. A. Bopp;G. Tarrach
我们对由玻璃棱镜上的氩离子激光束全内反射引起的驻倏逝波进行了详细分析，并研究了与光子扫描隧道显微镜亚波长介电尖端的耦合，该显微镜在棱镜表面近距离进行光栅扫描。倏逝场的强度以 239.2 nm 的周期进行空间调制。随着距棱镜表面距离的增加，它呈指数衰减，常数为 103.9 nm。倏逝波驻波的精确测量可用于校准扫描仪并允许确定尖端的空间分辨率和耦合效率。
We present a detailed analysis of a standing evanescent wave that is caused by total internal reflection of an Ar-ion laser beam on a glass prism and investigate the coupling to a subwavelength dielectric tip of a photon-scanning tunneling microscope that is raster scanned at a close distance over the prism surface. The intensity of the evanescent field is spatially modulated with a period of 239.2 nm. It decays exponentially with a constant of 103.9 nm with increasing distance from the prism surface. Precise measurements of the standing evanescent wave can be used to calibrate the scanner and permit one to determine the spatial resolution and the coupling efficiency of the tip.