A mechanical microscope: High-speed atomic force microscopy
A mechanical microscope: High-speed atomic force microscopy
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DOI：
10.1063/1.1855407
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发表时间：
2005-01-17
影响因子：
4
通讯作者：
Hobbs, JK
中科院分区：
文献类型：
--
作者：
Humphris, ADL;Miles, MJ;Hobbs, JK
介绍了一种能在20ms内获得图像的原子力显微镜。利用微谐振器作为扫描级，通过实现带宽大于2 MHz的无源机械反馈环路，获得了相对于传统原子力显微镜1000倍的图像采集速度。这使得可以在14.3ms内采集柔软的结晶和熔融聚合物表面的图像，尖端速度为22.4厘米S(-1)，同时保持纳米分辨率。(C)2005年美国物理研究所。
An atomic force microscope capable of obtaining images in less than 20 ms is presented. By utilizing a microresonator as a scan stage, and through the implementation of a passive mechanical feedback loop with a bandwidth of more than 2 MHz, a 1000-fold increase in image acquisition rate relative to a conventional atomic force microscope is obtained. This has allowed images of soft crystalline and molten polymer surfaces to be collected in 14.3 ms, with a tip velocity of 22.4 cm s(-1) while maintaining nanometer resolution. (C) 2005 American Institute of Physics.