Observation of magnetization reversal processes in Co–Cr and Co–Cr–Ta ultrathin films under the canted magnetic field using anomalous Hall effect
Observation of magnetization reversal processes in Co–Cr and Co–Cr–Ta ultrathin films under the canted magnetic field using anomalous Hall effect
复制标题
利用反常霍尔效应观察倾斜磁场下 Co-Cr 和 Co-Cr-Ta 超薄膜的磁化反转过程
DOI：
10.1063/1.372496
复制
发表时间：
2000
影响因子：
3.2
通讯作者：
M. Naoe
中科院分区：
文献类型：
--
作者：
S. Nakagawa;A. Sato;I. Sasaki;M. Naoe
利用振动样品磁强计测量的异常霍尔电压和磁化强度，导出了倾斜磁场下超薄Co-Cr-Ta薄膜的归一化磁化矢量Me。由于Co-Cr-Ta晶体在垂直方向上的c轴取向较弱，在高衬底温度下沉积的薄膜显示出相对较多的面内成分。对于c轴取向较差的薄膜，剩余状态的面内分量似乎较大。在200℃以上的高温下，将Pt下层正规化以促进其上沉积的Co-Cr-Ta膜的C轴取向。在20nm厚的Pt衬底上沉积30nm厚的Co77Cr20Ta3薄膜，具有较大的垂直矫顽力。Co77Cr20Ta3(30 nm)/Pt（20 nm）的归一化磁化轨迹表明，即使在非归一化方向施加磁场，薄膜也显示出较大的垂直磁化分量。
Normalized magnetization vector Me of ultrathin Co–Cr–Ta films under the canted magnetic field were derived from the results of anomalous Hall voltage and the magnetization measured by a vibrating sample magnetometer. The film deposited at high substrate temperature revealed a relatively large amount of an in-plane component because of the faint c-axis orientation in the perpendicular direction of the Co–Cr–Ta crystallites. The in-plane component at the remanent state seems to be larger for the film with worse c-axis orientation. The Pt underlayer was normalized to promote c-axis orientation in Co–Cr–Ta films deposited on it at a high substrate temperature above 200 °C. A 30 nm-thick Co77Cr20Ta3 film deposited on a 20-nm-thick Pt underlayer exhibited large perpendicular coercivity. The locus of normalized magnetization of the Co77Cr20Ta3(30 nm)/Pt(20 nm) implied that the film revealed a large perpendicular magnetization component even though the magnetic field was applied in the direction out of the norma...