Photothermal FT-IR spectroscopy: A step towards FT-IR microscopy at a resolution better than the diffraction limit
Photothermal FT-IR spectroscopy: A step towards FT-IR microscopy at a resolution better than the diffraction limit
复制标题
DOI：
10.1366/0003702991947379
复制
发表时间：
1999-07-01
影响因子：
3.5
通讯作者：
Jewkes, K
中科院分区：
文献类型：
--
作者：
Hammiche, A;Pollock, HM;Jewkes, K
我们已经使用了一个小型化的Wollaston线电阻温度计作为探针，记录红外吸收光谱的聚合物样品通过检测光热引起的温度波动在样品表面。这种方法开辟了吸收傅里叶变换红外光谱/显微镜的方式，其空间分辨率不再是衍射限制，而是由探针和样品之间的接触尺寸决定。目前，这是在几百纳米的数量级上。热探头，在扫描热显微镜和微热分析中使用的类型，使我们能够检测暴露于傅里叶变换红外光谱仪的光束，从而加热的样品的光热响应。来自该探头的信号测量所产生的温度波动，并因此提供干涉图，该干涉图取代通常通过直接检测样品透射的IR而获得的干涉图。
We have used a miniaturized Wollaston wire resistive thermometer as a probe to record infrared absorption spectra of polymeric samples by detecting photothermally induced temperature fluctuations at the sample surface. This method opens the way to absorption Fourier transform infrared spectroscopy/microscopy with a spatial resolution that is no longer diffraction limited, but is determined instead by the size of the contact between probe and sample. At present, this is on the order of a few hundred nanometers. The thermal probe, of a type used in scanning thermal microscopy and microthermal analysis, allows us to detect the photothermal response of a specimen exposed to the beam of a Fourier transform infrared spectrometer and heated thereby. The signal from this probe measures the resulting temperature fluctuations, and thus provides an interferogram which replaces the interferogram normally obtained by means of direct detection of the IR transmitted by a sample.