Polarization sensitive detection of 100 GHz radiation by high mobility field-effect transistors
Polarization sensitive detection of 100 GHz radiation by high mobility field-effect transistors
复制标题
通过高迁移率场效应晶体管对 100 GHz 辐射进行偏振敏感检测
DOI:
10.1063/1.2957065
复制
发表时间:
2008
影响因子:
3.2
通讯作者:
W. Gwarek
中科院分区:
文献类型:
--
作者:
M. Sakowicz;J. Łusakowski;K. Karpierz;M. Grynberg;W. Knap;W. Gwarek
Detection of 100 GHz electromagnetic radiation by a GaAs/AlGaAs high electron mobility field-effect transistor was investigated at 300 K as a function of the angle α between the direction of linear polarization of the radiation and the symmetry axis of the transistor. The angular dependence of the detected signal was found to be A0 cos2(α−α0)+C with A0, α0, and C dependent on the electrical polarization of the transistor gate. This dependence is interpreted as due to excitation of two crossed phase-shifted oscillators. A response of the transistor chip (including bonding wires and the substrate) to 100 GHz radiation was numerically simulated. Results of calculations confirmed experimentally observed dependencies and showed that the two oscillators result from an interplay of 100 GHz currents defined by the transistor impedance together with bonding wires and substrate related modes.