Study of microstructure, electronic structure and thermal properties of Al2O3-doped tetragonal YSZ coatings
Study of microstructure, electronic structure and thermal properties of Al2O3-doped tetragonal YSZ coatings
复制标题
Al2O3掺杂四方YSZ涂层的显微结构、电子结构及热性能研究
DOI：
10.1016/j.apsusc.2020.148553
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发表时间：
2021
影响因子：
6.7
通讯作者：
Zeng Yi
中科院分区：
文献类型：
--
作者：
Song Xuemei;Xu Yanjie;Ding Yi;Zhang Jimei;Guo Xiang;Jiang Caifen;Zheng Wei;Zeng Yi
采用等离子喷涂技术在不同喷涂工艺参数下制备了Al 2 O3掺杂的t-YSZ涂层。方差分析表明，只有Al 2 O3添加量显着影响涂层的热性能。电子结构和微观结构分析结果表明，随着Al 2 O3添加量的增加，缺陷数量和晶界密度增加，声子散射增强，热导率降低，表明Al 2 O3的添加可以提高YSZ涂层的绝缘性能。随着Al 2 O3添加量的增加，界面密度增加，这是由于Al 2 O3-YSZ复合材料熔点降低、晶格畸变以及非晶结构和单斜Al 2 O3在晶界钉扎的存在而导致的再结晶。Al 2 O3的热膨胀系数的变化是由于晶格常数的变化引起的Al 2 O3掺杂的t-YSZ的结合强度的变化。
Al2O3-doped tetragonal yttria-stabilized zirconia (t-YSZ) coatings were prepared by plasma spraying under various spraying parameters. The analysis of variance reveals that only Al2O3addition significantly affects thermal properties of coatings. The electronic structures and microstructures results show that the increase in number of defects and boundary density with the increasing addition of Al2O3enhances phonon scattering resulting in a decrease in the thermal conductivity, which suggests that the Al2O3addition can improve the insulation performance of the YSZ coating. The increase in boundary density with the increase in Al2O3addition is due to recrystallization resulting from the decreasing melting point of Al2O3–YSZ composites, lattice distortion, and the presence of amorphous structure and monoclinic Al2O3pinning at grain boundaries. The change in the coefficient of thermal expansion with Al2O3addition is attributable to the variation in the bonding strength of the Al2O3-doped t-YSZ caused by the change in lattice constants.