Semiautomatic permeance tester for thick magnetic films
Semiautomatic permeance tester for thick magnetic films
复制标题
半自动厚磁膜磁导测试仪
DOI：
10.1063/1.1134339
复制
发表时间：
1975
期刊：
影响因子：
--
通讯作者：
D. Thompson
中科院分区：
文献类型：
--
作者：
P. Calcagno;D. Thompson
研制了一种测量磁性薄膜磁导的装置，测量频率为1-100 MHz，磁导可达20000 μ，测量精度为±100 μ。这适用于0.5-5 μ厚度范围的坡莫合金膜，其用于在该频率范围内操作的薄膜记录头。
An apparatus has been developed for the measurement of the permeance (effective permeability–thickness product) of magnetic films for frequencies 1–100 MHz and permeances up to 20 000 μ with an accuracy of ±100 μ. This is suitable for permalloy films in the 0.5–5 μ thickness range, which are used in thin film recording heads operating in this frequency range.