Optical and thermoelectric properties of nano-particles based Bi2(Tei-xSex)3 thin films
Optical and thermoelectric properties of nano-particles based Bi2(Tei-xSex)3 thin films
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DOI：
10.1016/j.spmi.2016.09.034
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发表时间：
2017-01-01
影响因子：
3.1
通讯作者：
Petkov, P.
中科院分区：
文献类型：
--
作者：
Adam, A. M.;Lilov, E.;Petkov, P.
采用真空热蒸发技术在熔融法制备的块体合金上制备了纳米Bi_2Te_3和Bi-2（Tei-xSex）（3）薄膜。在300- 473 K温度范围内研究了其光学和热电性质。通过EDX和XRD分析证实了未掺杂和Se掺杂的Bi 2 Te 3纳米颗粒的形成。TEM、SEM和AFM分析表明，所制备的薄膜为多晶薄膜。电导率和塞贝克系数的测量，以及热导率的计算，导致在高温下的热电功率的最高值被报告。在463 K下，（Bi_2Se_（0.3）Te_（1.7））样品的功率因数最大值为62.82917 μ WK（-2）cm（-1）。在Bi_2 Te_3薄膜中加入Se，可使薄膜的电子热导率（K-el）从2.181 × 10 ~（-2）降低到0.598 × 10 ~（-2）（μ W/cm·K）。品质因数（ZT）的计算表明，在室温下的最大值为0.85，Bi 2 Te 3。除了在较高温度下所有样品的ZT值增加之外，令人惊讶地，获得了（Bi 2Se 1.2Te 1.8）的2.75的值。我们相信我们的研究结果可以为新的应用开辟道路。(C)2016爱思唯尔有限公司版权所有
Nano-particles of Bi2Te3 and Bi-2(Tei-xSex)(3) films were deposited using vacuum thermal evaporation technique from previously prepared bulk alloys synthesized by melting method. Optical and thermoelectric properties were studied in the temperature range of 300-473K. The formation of none- and Se-doped Bi2Te3 nano-particles was verified by EDX and XRD analysis. TEM, SEM and AFM analysis showed the prepared films are polycrystalline in nature. The measurements of electrical conductivity and Seebeck coefficient, alongside with thermal conductivity calculations, resulted in the highest values of thermoelectric power at high temperature to be reported. The maximum value of power factor was calculated at 62.82917 mu WK(-2)cm(-1) for (Bi2Se0.3Te1.7) sample at 463 K. On the addition of Se to Bi2Te3 film, a significant decrease of the electronic thermal conductivity (K-el) from 2.181 x 10(-2) to 0.598 x 10(-2) (mu W/cm.K) could be achieved. Figure of merit (ZT) calculations showed a maximum value of 0.85 at room temperature, for Bi2Te3. Besides the increase of ZT value for all samples at higher temperature, surprisingly, a value of 2.75 for (Bi2Se1.2Te1.8) was obtained. We believe our results could open avenues for new applications. (C) 2016 Elsevier Ltd. All rights reserved.