Quantitative X-ray fluorescence analysis of an Egyptian faience pendant and comparison with PIXE
Quantitative X-ray fluorescence analysis of an Egyptian faience pendant and comparison with PIXE
复制标题
埃及彩陶吊坠的定量 X 射线荧光分析及与 PIXE 的比较
DOI：
10.1007/s00216-009-2974-7
复制
发表时间：
2009
影响因子：
4.3
通讯作者：
P. Walter
中科院分区：
文献类型：
--
作者：
L. Viguerie;A. Durán;A. Bouquillon;V. A. Solé;J. Castaing;P. Walter
X射线荧光(XRF)技术是考古领域中使用便携式仪器进行现场调查的一种常见选择。这项工作表明，XRF便携式系统可以使用适当的软件进行定量分析，获得与粒子诱导X射线发射(PIXE)等其他技术提供的类似精度，如埃及光彩吊坠和两个玻璃标准。
The X-ray fluorescence (XRF) technique is a common choice in the archaeometric field for in situ investigations with portable instruments. This work shows that XRF portable systems can be used for quantitative analyses using appropriate software, obtaining a similar accuracy to that provided with other techniques such as particle-induced X-ray emission (PIXE), as shown for an Egyptian faience pendant and for two glass standards.