Full-Field Subwavelength Imaging Using a Scattering Superlens
Full-Field Subwavelength Imaging Using a Scattering Superlens
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DOI：
10.1103/physrevlett.113.113901
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发表时间：
2014-09-09
影响因子：
8.6
通讯作者：
Park, YongKeun
中科院分区：
文献类型：
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作者：
Park, Chunghyun;Park, Jung-Hoon;Park, YongKeun
光-物质相互作用使光学显微镜具有巨大的通用性，与其他成像方法相比，如电子显微镜，扫描探针显微镜或X射线散射，其中样品制备存在各种限制，并且该方法不适用于活细胞的生物成像。然而，由于衍射极限，这是以有限的分辨率为代价的。在这里，我们展示了一种新的方法，利用无序纳米粒子的弹性散射，实现亚衍射极限成像。测量的远场散斑场可用于通过时间反演重建目标的亚波长细节，这允许全场动态超分辨率成像。散射超透镜的制造非常简单，并且该方法对所使用的光的波长没有限制。
Light-matter interaction gives optical microscopes tremendous versatility compared with other imaging methods such as electron microscopes, scanning probe microscopes, or x-ray scattering where there are various limitations on sample preparation and where the methods are inapplicable to bioimaging with live cells. However, this comes at the expense of a limited resolution due to the diffraction limit. Here, we demonstrate a novel method utilizing elastic scattering from disordered nanoparticles to achieve subdiffraction limited imaging. The measured far-field speckle fields can be used to reconstruct the subwavelength details of the target by time reversal, which allows full-field dynamic super-resolution imaging. The fabrication of the scattering superlens is extremely simple and the method has no restrictions on the wavelength of light that is used.