O ct 2 01 4 Complex oxide growth using simultaneous in situ RHEED and x-ray reflectivity : When is one layer complete ?
O ct 2 01 4 Complex oxide growth using simultaneous in situ RHEED and x-ray reflectivity : When is one layer complete ?
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发表时间:
2014
影响因子:
1.9
通讯作者:
M. C. Sullivan;M. Ward;A. Gutiérrez–Llorente;E. Adler;H. Joress;A. Woll;J. Brock
中科院分区:
文献类型:
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作者:
M. C. Sullivan;M. Ward;A. Gutiérrez–Llorente;E. Adler;H. Joress;A. Woll;J. Brock
M. C. Sullivan, 2, ∗ M. J. Ward, Araceli Gutiérrez-Llorente, Eli R. Adler, 3 H. Joress, 4 A. Woll, and J. D. Brock 3 Department of Physics and Astronomy, Ithaca College, Ithaca NY, USA School of Applied and Engineering Physics, Cornell University, Ithaca NY, USA Cornell High Energy Synchrotron Source, Cornell University, Ithaca NY, USA Department of Materials Science and Engineering, Cornell University, Ithaca NY, USA (Dated: October 6, 2014)