Structural Test and Diagnosis for Graceful Degradation of NoC Switches
Structural Test and Diagnosis for Graceful Degradation of NoC Switches
复制标题
NoC交换机优雅降级的结构测试与诊断
DOI：
10.1007/s10836-012-5329-9
复制
发表时间：
2012
期刊：
影响因子：
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通讯作者：
H. Wunderlich
中科院分区：
文献类型：
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作者：
Atefe Dalirsani;S. Holst;Melanie Elm;H. Wunderlich
片上网络（noc）具有隐式容错性，由于其固有的冗余性，它们可以克服有缺陷的核心、链路和交换机。这种效应可以用来提高产量，但代价是降低性能。本文提出了一种新的基于工业体积测试标准流程的诊断方法，该方法能够识别故障网络交换机的完整功能，而不是仅提供完整交换机的合格/不合格结果。为了实现这一目标，新方法首次将结构测试的精度与存在缺陷时功能行为的信息结合起来。这允许在生产测试后禁用有缺陷的开关部件，并使用完整的功能。因此，只有一个最小的性能下降是诱导而产量增加。实验结果表明，由于两种典型交换机模型中56.86%和72.42%的缺陷仅损害一个交换机端口，因此该方法提高了noc的性能。与以前实现容错开关的方法不同，所开发的技术不增加任何额外的面积开销，并且与许多常见的开关设计兼容。
Networks-on-Chip (NoCs) are implicitly fault tolerant and due to their inherent redundancy they can overcome defective cores, links and switches. This effect can be used to increase yield at the cost of reduced performance. In this paper, a new diagnosis method based on the standard flow of industrial volume testing is presented, which is able to identify the intact functions of a defective network switch rather than providing only a pass/fail result for the complete switch. To achieve this, the new method combines for the first time the precision of structural testing with information on the functional behavior in the presence of defects. This allows to disable defective parts of a switch after production test and use the intact functions. Thereby, only a minimum performance decrease is induced while the yield is increased. According to the experimental results, the method improves the performability of NoCs since 56.86 % and 72.42 % of defects in two typical switch models only impair one switch port. Unlike previous methods for implementing fault tolerant switches, the developed technique does not impose any additional area overhead and is compatible with many common switch designs.