Observation of phonons with resonant inelastic x-ray scattering
Observation of phonons with resonant inelastic x-ray scattering
复制标题
利用共振非弹性 X 射线散射观察声子
DOI：
10.1088/0953-8984/22/48/485601
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发表时间：
2010
期刊：
影响因子：
--
通讯作者：
E. Alp
中科院分区：
文献类型：
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作者：
Hasan Yavaş;Hasan Yavaş;M. V. Veenendaal;M. V. Veenendaal;J. V. D. Brink;L. Ament;A. Alatas;Bogdan M. Leu;M. Apostu;N. Wizent;Günter Behr;W. Sturhahn;H. Sinn;E. Alp
声子，晶格振动的量子力学表示，以及它们与电子自由度的耦合对于理解材料的热和电性质是重要的。对于第一次，声子已被测量使用共振非弹性X射线散射（RIXS）在氧化铜（CuO）的铜K-边缘。利用超短核孔寿命近似和精确对角化技术分析这些谱，我们可以解释基本的非弹性特征。相对光谱强度与电子-声子耦合强度有关。
Phonons, the quantum mechanical representation of lattice vibrations, and their coupling to the electronic degrees of freedom are important for understanding thermal and electric properties of materials. For the first time, phonons have been measured using resonant inelastic x-ray scattering (RIXS) across the Cu K-edge in cupric oxide (CuO). Analyzing these spectra using an ultra-short core-hole lifetime approximation and exact diagonalization techniques, we can explain the essential inelastic features. The relative spectral intensities are related to the electron–phonon coupling strengths.