Development of a depth-resolved x-ray magnetic circular dichroism: application to Fe/Cu(100) ultrathin films
Development of a depth-resolved x-ray magnetic circular dichroism: application to Fe/Cu(100) ultrathin films
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深度分辨X射线磁圆二色性的发展：在Fe/Cu(100)超薄膜中的应用
DOI：
10.1088/0953-8984/15/5/310
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发表时间：
2003
期刊：
影响因子：
--
通讯作者：
T. Ohta
中科院分区：
文献类型：
--
作者：
K. Amemiya;S. Kitagawa;D. Matsumura;T. Yokoyama;T. Ohta
通过控制电子产额XMCD谱的探测深度，将深度分辨技术应用于X射线磁性圆二色谱(XMCD)方法。这项技术被用来研究生长在铜(100)上的4ML和8ML Fe薄膜的磁结构，这些薄膜具有特殊的磁深度分布。直观地表明，4ML薄膜是均匀磁化的，而8ML薄膜的磁矩集中在表面。分别提取了4层膜各层的XMCD光谱。所有提取的光谱几乎彼此相同，证实了整个薄膜的铁磁耦合。对于8ML薄膜，表面两层是铁磁耦合的，而内层是自旋密度波，波数Q=2π/2.4d。
A depth-resolved technique is applied in the x-ray magnetic circular dichroism (XMCD) method by controlling the probing depth of the electron yield XMCD spectra. The usefulness of this technique is demonstrated for the study of magnetic structures of 4 and 8 ML Fe films grown on Cu(100), which are known to exhibit peculiar magnetic depth profiles. It was directly shown that the 4 ML film is uniformly magnetized, while the magnetic moment is localized at the surface in the case of the 8 ML film. The XMCD spectrum for each layer of the 4 ML film was separately extracted. All the extracted spectra were almost identical to each other, confirming the ferromagnetic coupling over the whole film. As for the 8 ML film, it was suggested that the surface two layers are ferromagnetically coupled, while the inner layers are in a spin density wave state with a wavenumber q = 2π/2.4d.