Conductance of single C60 molecule bridging metal electrodes
Conductance of single C60 molecule bridging metal electrodes
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DOI：
10.1021/jp802475k
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发表时间：
2008-06-05
影响因子：
3.7
通讯作者：
Murakoshi, Kei
中科院分区：
文献类型：
--
作者：
Kiguchi, Manabu;Murakoshi, Kei
我们研制了一个超高真空(UHV)系统，该系统配备了一个机械可控的断口结，用于研究超高真空中的单分子电导。在不打破真空的情况下，制备了金属纳米间隙并将分子引入到金属纳米间隙中。利用该系统研究了300K下Au和Ag电极之间单分子C-60的电导，测得与An和Ag电极连接的单分子结的电导分别为0.2(+/-0.1)G(0)(G(0)=2e(2)/h)和0.5(+/-0.1)G(0)。通过分析拉伸过程中观察到的电导轨迹和电导直方图，深入了解了分子结的稳定性。
We have developed an ultrahigh vacuum (UHV) system equipped with a mechanically controllable break junction to investigate single molecular conductivity in UHV. Fabrication of the metal nanogap and introduction of molecules into the metal nanogap were performed without breaking vacuum. Using this system, we investigated the electrical conductance of a single C-60 molecule bridging between Au or Ag electrodes at 300 K. The conductance of C-60 was determined to be 0.2(+/- 0.1) G(0) (G(0)=2e(2)/h) and 0.5 (+/- 0.1) G(0) for the single molecular junction with An and Ag electrodes, respectively. Insight into the stability of the molecular junction was obtained by analyzing the conductance traces and conductance histograms observed at the transformation process during the stretching.