Temperature and thermal stress around an elliptic functional defect in a thermoelectric material

Temperature and thermal stress around an elliptic functional defect in a thermoelectric material
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DOI:
10.1016/j.mechmat.2019.01.008
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发表时间:
2019-03
影响因子:
3.9
通讯作者:
Hao Song;K. Song;C. Gao
Hao Song;K. Song;C. Gao
中科院分区:
材料科学2区
文献类型:
--
作者:
Hao Song;K. Song;C. Gao

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