High-order birefringence measurement using spectroscopic polarized light
High-order birefringence measurement using spectroscopic polarized light
复制标题
使用分光偏振光测量高阶双折射
DOI：
10.1117/12.406620
复制
发表时间：
2000
期刊：
影响因子：
--
通讯作者：
T. Yoshizawa
中科院分区：
文献类型：
--
作者：
H. Kowa;K. Muraki;Y. Otani;N. Umeda;T. Yoshizawa
本文介绍了一种高次方位向二维延迟量的测量方法和装置。该系统基于使用交叉偏振器通过改变光谱偏振光。64组图像用于双折射分析。光谱干涉图随波数呈正弦变化，周期与样品的双折射成正比。给出了塑料和标准相位延迟板的二维双折射分布的测量结果。傅里叶变换法和最大熵法可以实现高分辨率的双折射测量。文中给出了两个测量实例，一个是按台阶叠层的取向聚合物薄膜的测量，另一个是双折射分布的测量。
The paper covers an issue of method and device for measurement of two-dimensional retardance with high-order and azimuthal direction. The system based on the use of a crossed polarizer by changing spectroscopic polarized light. Sixty-four sets of images are used for birefringence analysis. The spectroscopic interferogram change sinusoidal with wave number and the period is in proportion to birefringence of specimen. The measured results of the two dimensional birefringence distribution of a plastic and standard phase plate of retardation are shown. Fourier transform method and maximum entropy method enable to measure birefringence with high resolution. Two examples, measurement of aligned polymer film, which is laminated as steps, and that of birefringence distribution, are demonstrated.