Ultrashort-pulse reflectometer on LHD
Ultrashort-pulse reflectometer on LHD
复制标题
LHD 上的超短脉冲反射计
DOI：
10.1063/1.1786645
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发表时间：
2004
影响因子：
1.6
通讯作者：
K. Kawahata
中科院分区：
文献类型：
--
作者：
Y. Kogi;K. Uchida;A. Mase;L. Bruskin;M. Ignatenko;T. Tokuzawa;Y. Nagayama;K. Kawahata
我们已将超短脉冲反射计应用于大型螺旋装置等离子体，以进行密度分布测量。脉冲的频率范围上变频到R波段，对应于普通模式下边缘等离子体区域的截止频率。来自等离子体的反射波被采样镜接收并直接记录。该系统可以通过使用理想带宽高达1 Gbps的超宽带科学信息网络（super-SINET）从远程站点（九州大学）进行控制和监视。测量结果表明，在测量过程中等离子体密度达到稳定状态时，我们确认了来自等离子体的反射波。
We have applied an ultrashort-pulse reflectometer to large helical device plasmas for density profile measurement. The frequency range of the impulse is up-converted into the R band, which corresponds to the cutoff frequency of edge plasma region in the ordinary mode. The reflected wave from plasma is received and directly recorded by a sampling scope. This system can be controlled and monitored from remote site (Kyushu University) by using ultrawideband science information network (super-SINET) that ideal bandwidth reaches up to 1 Gbps. As a result of the measurement, we have confirmed reflection wave from the plasma when the plasma density reaches steady state during the measurement.