Microwave solid-state left-handed material with a broad bandwidth and an ultralow loss
Microwave solid-state left-handed material with a broad bandwidth and an ultralow loss
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DOI：
10.1103/physrevb.70.073102
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发表时间：
2004-08
影响因子：
3.7
通讯作者：
L. Ran;J. Huangfu;Hongsheng Chen;Y. K. Li;Xianmin Zhang;Kangsheng Chen;J. Kong
中科院分区：
文献类型：
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作者：
L. Ran;J. Huangfu;Hongsheng Chen;Y. K. Li;Xianmin Zhang;Kangsheng Chen;J. Kong
本文介绍了一种用标准热压技术制备的用于印制电路板的微波超材料的固态样品。我们通过三个实验证明了该样品是一种负折射率的左手材料。三个实验分别是功率传输、棱镜折射和光束移动。我们使用不同形状的样品进行实验，并在$1\text{\ensuremath{-}}\ mathm {GHz}$宽的通频带中观察到明显的左手行为，插入损耗小于$0.5\phantom{\rule{0.3em}{0ex}}\ mathm {dB}$，这并不大于许多微波器件的插入损耗。样品具有非常稳定的特性，所有的结果都是一致的。
We present in this paper a solid-state sample of microwave metamaterial produced by a standard hot-press technique for the manufacture of printed circuit boards. We performed three experiments to demonstrate that this sample is a left-handed material with negative refractive index. The three experiments are power transmission, prism refraction, and beam shifting. We used differently shaped samples for the experiments and observed clear left-handed behaviors in a $1\text{\ensuremath{-}}\mathrm{GHz}$-wide passband with an insertion loss of less than $0.5\phantom{\rule{0.3em}{0ex}}\mathrm{dB}$ per unit cell, which is no greater than the insertion loss of many microwave devices. The sample has very stable characteristics and all results are consistent with one another.